The Windows Logo Program Newsletter provides up to date information about the Windows Logo Program. Did you get this newsletter from a friend?
Subscribe to the Windows Logo Program Newsletter.
Device metadata is now accepting bulk uploads! Users can upload as many as fifty (50) device metadata packages into a single experience at one time. All packages will be uploaded into the same experience, and will be marked as Preview or not Preview according to the option selected. You can upload Device metadata packages in bulk into either a new experience or an existing experience, and you can also upload PC metadata packages can in bulk.
Uploading is easy! When creating a
new experience, enter an
Experience Name, use the browse button to select multiple packages, designate whether to upload all the packages as Preview or not Preview, select the proper logo option, and click
Upload. When updating an
existing experience, navigate to the experience, use the browse button to select multiple packages, fill out any other required information, and click
Upload.
Note: The Friendly Name option is not available when uploading multiple packages.
You must follow the rules listed in the help documents at
https://winqual.microsoft.com/member/DeviceMetadata/default.aspx for all device metadata packages. Additionally, all device metadata packages uploaded to Windows Quality Online Services (Winqual) must be signed with the certificate your company has on file with Winqual.
The Microsoft Multipath I/O (MPIO) test was removed from the Hardware-based RAID (Storage Array) test category in Windows Logo Kit (WLK) 1.5. This test had many issues which resulted in support calls, errata, and in some cases missed test coverage. A new version of this test is under development and will be released in a future version of the WLK. WLK 1.5 has no specific MPIO testing for RAID systems. The current process for testing hardware-based RAID systems that support MPIO is to check the MPIO box in the submission wizard and run all the tests that are exposed in the Driver Test Manager (DTM). RAID systems will get the same test report they have received in the past for MPIO submissions as long as the MPIO box is checked.
